Radiation damage bigger problem in microelectronics than previously thought
1,113 views · Published 19 July 2012 · 0:08 · Indexed 4 November 2026
Channel: Vanderbilt University · 2012 · Education
The amount of damage that radiation causes in electronic materials may be at least 10 times greater than previously thought. That is the surprising result of a new characterization method that uses a combination of lasers and acoustic waves to that allows scientists to peer through solid materials to pinpoint the size and location of detects buried deep inside with unprecedented precision. To read the full article, please visit: http://news.vanderbilt.edu/2012/07/radiation-damage/
