Engineer It: Understanding Transient Immunity for Analog I/O Modules
2,137 views · Published 1 May 2014 · 5:11 · Indexed 8 November 2026
Channel: Texas Instruments · 2014 · Science & Technology
Learn about tests you can perform to help protect your IC from electrical over-stress (EOS) damage and improve system reliability.
More from this channel
-
8:13
TI ClockPro Software
-
6:31
Explore Sensor Fusion Apps with the Sensor Hub BoosterPack!
-
9:32
Ease software development by using TI-RTOS with TI MCU
-
16:46
CC3000 TI module enabled by SmartConfig
-
17:02
OpenCL on Keystone Multicore Processors
-
1:00
BeagleBone Black Board Tour
-
1:02
BeagleBone Black Reveal
-
2:13
EMI-Hardened Op Amps